Shenzhen Reunion Electronics Co.,Ltd.
Shenzhen Reunion Electronics Co.,Ltd.
News

F Series Metal Push-Pull Connectors: Integrating High-Density Mounting and Waterproof Performance

2026-07-06 0 Leave me a message

For applications requiring both high-density mounting and harsh-environment protection, the F series metal push-pull connectors offer a balanced and efficient solution. This series features a split push-pull structure with a self-latching function upon mating and incorporates a half-circle positioning key system to prevent mismating, ensuring convenient and accurate operation.

The most prominent feature of the F series is its high-density and miniaturized design. It supports multi-contact types from 1 to 40 pins, enabling more connection points within a limited space, making it ideal for high-density installations and confined spaces. Simultaneously, it achieves an IP68 protection rating, effectively providing waterproof and sand-proof performance in harsh outdoor environments. The series is available in straight and 90-degree angle styles and supports various termination methods, including solder and PCB contacts.

The technical performance of this series is robust, with over 5,000 mating cycles, an operating temperature range of -55°C to +145°C, and resistance to high-intensity vibration and mechanical shock. Its 360-degree shielding design provides comprehensive EMC protection. The F series connectors are particularly suitable for chassis environments with limited installation space; for example, the protruding rear nut fixed socket mounting method can further reduce the chassis size.

Leveraging its high-density, compact size, and waterproof characteristics, the F series metal waterproof push-pull connectors are widely used in both military and civilian fields, including radio equipment, medical electronics, test and measurement, audio-video, and industrial control. The half-circle positioning system and various derivative series, such as T and C series, further enrich the application options.

Related News
Leave me a message
X
We use cookies to offer you a better browsing experience, analyze site traffic and personalize content. By using this site, you agree to our use of cookies.Privacy Policy
RejectAccept